ISIC CP12 tester specifications available from stock

Use: ATE test is an indispensable part of the chip design – manufacturing – application industry chain, mainly used in chip design, wafer manufacturing, packaging and testing three links. The probe station is mainly used in wafer testing to contact the probe with the solder joint or electrode on the chip to achieve signal transmission and testing.
Technical features: Nagawa Technology probe CP12 has certain technical advantages, the specific parameters may be different due to different application scenarios and requirements. In general, the parameters of the probe station may include positioning accuracy, number of probes, probe spacing, moving range, repeated positioning accuracy, etc. These parameters are essential to ensure the accuracy and efficiency of the test. For example, the positioning accuracy determines the contact accuracy between the probe and the chip solder joint; The number and spacing of probes need to be reasonably designed according to the number and layout of the pins of the chip. Moving range and repeated positioning accuracy affect the coverage and consistency of the test.